Structure and spectroscopic ellipsometry studies of nanocrystalline Dy2O3 thin films deposited on Al2O3 wafers by electron beam evaporation technique
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چکیده
منابع مشابه
Spectroscopic ellipsometry of metal phthalocyanine thin films.
Optical functions of cobalt phthalocyanine, nickel phthalocyanine (NiPc), and iron phthalocyanine (FePc) have been determined by use of spectroscopic ellipsometry in the spectral range 1.55-4.1 eV (300-800 nm). The samples were prepared by evaporation onto glass and silicon substrates. The optical functions were determined by point-to-point fit. Absorption spectra were also measured. The index-...
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ژورنال
عنوان ژورنال: Journal of Materials Research and Technology
سال: 2021
ISSN: 2238-7854
DOI: 10.1016/j.jmrt.2021.04.008