Structure and spectroscopic ellipsometry studies of nanocrystalline Dy2O3 thin films deposited on Al2O3 wafers by electron beam evaporation technique

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ژورنال

عنوان ژورنال: Journal of Materials Research and Technology

سال: 2021

ISSN: 2238-7854

DOI: 10.1016/j.jmrt.2021.04.008